Author  |
Title |
Year |
Publication |
Volume |
Pages |
Briec, W.; Kerstens, K.; Leleu, H.; Vanden Eeckaut, P. |
Returns to Scale on Nonparametric Deterministic Technologies: Simplifying Goodness-of-Fit Methods Using Operations on Technologies |
2000 |
Journal of Productivity Analysis |
14 |
267-274 |
Briec, W.; Kerstens, K.; Vanden Eeckaut, P. |
Non-convex technologies and cost functions: definitions, duality and nonparametric tests of convexity |
2004 |
Journal of Economics |
81 |
155-192 |
Ferrier, G.D.; Kerstens, K.; Vanden Eeckaut, P. |
Radial and Nonradial Technical Efficiency Measures on a DEA Reference Technology: A Comparison using US Banking Data |
1994 |
Recherches Économiques de Louvain / Louvain Economic Review |
60 |
449-479 |
Fried, H.O.; Lovell, C.A.K.; Vanden Eeckaut, P. |
Evaluating the performance of United States credit unions |
1993 |
Journal of Banking and Finance |
17 |
251-265 |
Kerstens, K.; Vanden Eeckaut, P. |
Estimating Returns to Scale Using Non-Parametric Deterministic Technologies: A New Method Based on Goodness-of-Fit |
1999 |
European Journal of Operational Research |
113 |
206-214 |
Mairesse, F.; Vanden Eeckaut, P. |
Museum Assessment and FDH Technology: Towards a Global Approach |
2002 |
Journal of Cultural Economics |
26 |
261-286 |
Triantis, K.; Vanden Eeckaut, P. |
Fuzzy Pair-wise Dominance and Implications for Technical Efficiency Performance Assessment |
2000 |
Journal of Productivity Analysis |
13 |
207-230 |
Tulkens, H.; Vanden Eeckaut, P. |
Non-parametric efficiency, progress and regress measures for panel data: Methodological aspects |
1995 |
European Journal of Operational Research |
80 |
474-499 |